| Author | Vincent S. Wong |
|---|---|
| Title | Qualification and Management of Analysis Attributes with Application to Multi-Procedural Analyses for Multichip Modules |
| Year | 1994 |
| School | Mechanical Engineering |
| Institution | RPI |
| Abstract | Presented in this thesis is a generalized attribute manager that provides a consistent analysis framework in which analysis data may be defined, organized, and associated with appropriate model entities. An attribute is that information, beyond the geometric domain, needed to qualify the physical problem to be solved. This thesis is divided into two major portions: 1) presentation of the design and implementation of the SCOREC Attribute Manager (SAM) and 2) presentation of the application of the manager in conjunction with the preprocessing activities of the Rensselaer Electronic Packaging Analysis Software (REPAS) project. |
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